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authorJonathan Cameron <Jonathan.Cameron@huawei.com>2022-06-26 17:55:08 +0100
committerJonathan Cameron <Jonathan.Cameron@huawei.com>2022-07-18 18:38:27 +0100
commit6c6a6ee93999528c989438482e2d5cdcdd6bb688 (patch)
treea26e234f0ec266a02af8815caa738df47cc26205 /Documentation/ABI/testing/sysfs-bus-iio-thermocouple
parent295cc4268bb946a84f7681a9f032ade09a4087f8 (diff)
iio: ABI: temperature: Unify documentation for thermocouple fault detection.
Kernel documentation for a given ABI element should not be duplicated in multiple files, so pull them into one higher level documentation file. Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com> Cc: Navin Sankar Velliangiri <navin@linumiz.com> Cc: Paresh Chaudhary <paresh.chaudhary@rockwellcollins.com> Reviewed-by: Mauro Carvalho Chehab <mchehab@kernel.org> Link: https://lore.kernel.org/r/20220626165511.602202-2-jic23@kernel.org
Diffstat (limited to 'Documentation/ABI/testing/sysfs-bus-iio-thermocouple')
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diff --git a/Documentation/ABI/testing/sysfs-bus-iio-thermocouple b/Documentation/ABI/testing/sysfs-bus-iio-thermocouple
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+What: /sys/bus/iio/devices/iio:deviceX/fault_ovuv
+KernelVersion: 5.1
+Contact: linux-iio@vger.kernel.org
+Description:
+ Overvoltage or Undervoltage Input Fault. The internal circuitry
+ is protected from excessive voltages applied to the thermocouple
+ cables. The device can also detect if such a condition occurs.
+
+ Reading returns '1' if input voltage is negative or greater
+ than VDD, otherwise '0'.
+
+What: /sys/bus/iio/devices/iio:deviceX/fault_oc
+KernelVersion: 5.1
+Contact: linux-iio@vger.kernel.org
+Description:
+ Open-circuit fault. The detection of open-circuit faults,
+ such as those caused by broken thermocouple wires.
+ Reading returns '1' if fault, '0' otherwise.