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authorVignesh R <vigneshr@ti.com>2018-12-03 13:31:18 +0530
committerLee Jones <lee.jones@linaro.org>2018-12-03 11:33:20 +0000
commit4b3ab9372ffa569827c8f7b7ffc7b69ba544a3bd (patch)
tree25e4d43f90834fc71dd5aadf768b4b654c001a16 /drivers/mfd
parentb40ee006fe6a8a25093434e5d394128c356a48f3 (diff)
iio: adc: ti_am335x_tscadc: Improve accuracy of measurement
When performing single ended measurements with TSCADC, its recommended to set negative input (SEL_INM_SWC_3_0) of ADC step to ADC's VREFN in the corresponding STEP_CONFIGx register. Also, the positive(SEL_RFP_SWC_2_0) and negative(SEL_RFM_SWC_1_0) reference voltage for ADC step needs to be set to VREFP and VREFN respectively in STEP_CONFIGx register. Without these changes, there may be variation of as much as ~2% in the ADC's digital output which is bad for precise measurement. Signed-off-by: Vignesh R <vigneshr@ti.com> Acked-by: Jonathan Cameron <Jonathan.Cameron@huawei.com> Signed-off-by: Lee Jones <lee.jones@linaro.org>
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