summaryrefslogtreecommitdiff
path: root/tools/testing/nvdimm/test/nfit_test.h
diff options
context:
space:
mode:
authorDan Williams <dan.j.williams@intel.com>2015-06-17 17:23:32 -0400
committerDan Williams <dan.j.williams@intel.com>2015-06-26 11:23:38 -0400
commit6bc756193ff61bf5e7b3cfedfbb0873bf40f8055 (patch)
tree5b17fac71bf9989eb2f5ab4ff10e3c6fc01a3cbf /tools/testing/nvdimm/test/nfit_test.h
parent047fc8a1f9a6330eacc80374dff087e20dc2304b (diff)
tools/testing/nvdimm: libnvdimm unit test infrastructure
'libnvdimm' is the first driver sub-system in the kernel to implement mocking for unit test coverage. The nfit_test module gets built as an external module and arranges for external module replacements of nfit, libnvdimm, nd_pmem, and nd_blk. These replacements use the linker --wrap option to redirect calls to ioremap() + request_mem_region() to custom defined unit test resources. The end result is a fully functional nvdimm_bus, as far as userspace is concerned, but with the capability to perform otherwise destructive tests on emulated resources. Q: Why not use QEMU for this emulation? QEMU is not suitable for unit testing. QEMU's role is to faithfully emulate the platform. A unit test's role is to unfaithfully implement the platform with the goal of triggering bugs in the corners of the sub-system implementation. As bugs are discovered in platforms, or the sub-system itself, the unit tests are extended to backstop a fix with a reproducer unit test. Another problem with QEMU is that it would require coordination of 3 software projects instead of 2 (kernel + libndctl [1]) to maintain and execute the tests. The chances for bit rot and the difficulty of getting the tests running goes up non-linearly the more components involved. Q: Why submit this to the kernel tree instead of external modules in libndctl? Simple, to alleviate the same risk that out-of-tree external modules face. Updates to drivers/nvdimm/ can be immediately evaluated to see if they have any impact on tools/testing/nvdimm/. Q: What are the negative implications of merging this? It is a unique maintenance burden because the purpose of mocking an interface to enable a unit test is to purposefully short circuit the semantics of a routine to enable testing. For example __wrap_ioremap_cache() fakes the pmem driver into "ioremap()'ing" a test resource buffer allocated by dma_alloc_coherent(). The future maintenance burden hits when someone changes the semantics of ioremap_cache() and wonders what the implications are for the unit test. [1]: https://github.com/pmem/ndctl Cc: <linux-acpi@vger.kernel.org> Cc: Lv Zheng <lv.zheng@intel.com> Cc: Robert Moore <robert.moore@intel.com> Cc: Rafael J. Wysocki <rafael.j.wysocki@intel.com> Cc: Christoph Hellwig <hch@lst.de> Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Diffstat (limited to 'tools/testing/nvdimm/test/nfit_test.h')
-rw-r--r--tools/testing/nvdimm/test/nfit_test.h29
1 files changed, 29 insertions, 0 deletions
diff --git a/tools/testing/nvdimm/test/nfit_test.h b/tools/testing/nvdimm/test/nfit_test.h
new file mode 100644
index 000000000000..96c5e16d7db9
--- /dev/null
+++ b/tools/testing/nvdimm/test/nfit_test.h
@@ -0,0 +1,29 @@
+/*
+ * Copyright(c) 2013-2015 Intel Corporation. All rights reserved.
+ *
+ * This program is free software; you can redistribute it and/or modify
+ * it under the terms of version 2 of the GNU General Public License as
+ * published by the Free Software Foundation.
+ *
+ * This program is distributed in the hope that it will be useful, but
+ * WITHOUT ANY WARRANTY; without even the implied warranty of
+ * MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the GNU
+ * General Public License for more details.
+ */
+#ifndef __NFIT_TEST_H__
+#define __NFIT_TEST_H__
+
+struct nfit_test_resource {
+ struct list_head list;
+ struct resource *res;
+ struct device *dev;
+ void *buf;
+};
+
+typedef struct nfit_test_resource *(*nfit_test_lookup_fn)(resource_size_t);
+void __iomem *__wrap_ioremap_nocache(resource_size_t offset,
+ unsigned long size);
+void __wrap_iounmap(volatile void __iomem *addr);
+void nfit_test_setup(nfit_test_lookup_fn lookup);
+void nfit_test_teardown(void);
+#endif