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authorYasunori Goto <y-goto@jp.fujitsu.com>2017-06-15 14:04:16 +0900
committerDan Williams <dan.j.williams@intel.com>2017-06-15 14:31:41 -0700
commita117699c6c4a4b1b4e90ed51e393590986567cb4 (patch)
tree3d939774a4265cbb69bd5792a0e69ee6161cfa1b
parent8990cdf10cf50dc68aaf5a8479b04304d05f1581 (diff)
tools/testing/nvdimm: fix nfit_test buffer overflow
The root cause of panic is the num_pm of nfit_test1 is wrong. Though 1 is specified for num_pm at nfit_test_init(), it must be 2, because nfit_test1->spa_set[] array has 2 elements. Since the array is smaller than expected, the driver breaks other area. (it is often the link list of devres). As a result, panic occurs like the following example. CPU: 4 PID: 2233 Comm: lt-libndctl Tainted: G O 4.12.0-rc1+ #12 RIP: 0010:__list_del_entry_valid+0x6c/0xa0 Call Trace: release_nodes+0x76/0x260 devres_release_all+0x3c/0x50 device_release_driver_internal+0x159/0x200 device_release_driver+0x12/0x20 bus_remove_device+0xfd/0x170 device_del+0x1e8/0x330 platform_device_del+0x28/0x90 platform_device_unregister+0x12/0x30 nfit_test_exit+0x2a/0x93b [nfit_test] Cc: <stable@vger.kernel.org> Signed-off-by: Yasunori Goto <y-goto@jp.fujitsu.com> Signed-off-by: Dan Williams <dan.j.williams@intel.com>
-rw-r--r--tools/testing/nvdimm/test/nfit.c2
1 files changed, 1 insertions, 1 deletions
diff --git a/tools/testing/nvdimm/test/nfit.c b/tools/testing/nvdimm/test/nfit.c
index 28859da78edf..4c2fa98ef39d 100644
--- a/tools/testing/nvdimm/test/nfit.c
+++ b/tools/testing/nvdimm/test/nfit.c
@@ -1943,7 +1943,7 @@ static __init int nfit_test_init(void)
nfit_test->setup = nfit_test0_setup;
break;
case 1:
- nfit_test->num_pm = 1;
+ nfit_test->num_pm = 2;
nfit_test->dcr_idx = NUM_DCR;
nfit_test->num_dcr = 2;
nfit_test->alloc = nfit_test1_alloc;