diff options
author | Ben Hutchings <bhutchings@solarflare.com> | 2012-07-04 03:58:33 +0100 |
---|---|---|
committer | Ben Hutchings <bhutchings@solarflare.com> | 2012-07-17 16:12:33 +0100 |
commit | d4f2cecce138c34960c467d0ae38a6d4bcd6af7b (patch) | |
tree | 19a93bad8f6a56361b3b2f12beecae97be4d8ea0 /drivers/net/ethernet/sfc/selftest.c | |
parent | 0f1e54ae52b950ed79074ae794d027d6c97fd34e (diff) |
sfc: Disable VF queues during register self-test
Currently VF queues and drivers may remain active during this test.
This could cause memory corruption or spurious test failures.
Therefore we reset the port/function before running these tests on
Siena.
On Falcon this doesn't work: we have to do some additional
initialisation before some blocks will work again. So refactor the
reset/register-test sequence into an efx_nic_type method so
efx_selftest() doesn't have to consider such quirks.
In the process, fix another minor bug: Siena does not have an
'invisible' reset and the self-test currently fails to push the PHY
configuration after resetting. Passing RESET_TYPE_ALL to
efx_reset_{down,up}() fixes this.
Signed-off-by: Ben Hutchings <bhutchings@solarflare.com>
Diffstat (limited to 'drivers/net/ethernet/sfc/selftest.c')
-rw-r--r-- | drivers/net/ethernet/sfc/selftest.c | 62 |
1 files changed, 15 insertions, 47 deletions
diff --git a/drivers/net/ethernet/sfc/selftest.c b/drivers/net/ethernet/sfc/selftest.c index ccc428fc267b..96068d15b601 100644 --- a/drivers/net/ethernet/sfc/selftest.c +++ b/drivers/net/ethernet/sfc/selftest.c @@ -120,19 +120,6 @@ static int efx_test_nvram(struct efx_nic *efx, struct efx_self_tests *tests) return rc; } -static int efx_test_chip(struct efx_nic *efx, struct efx_self_tests *tests) -{ - int rc = 0; - - /* Test register access */ - if (efx->type->test_registers) { - rc = efx->type->test_registers(efx); - tests->registers = rc ? -1 : 1; - } - - return rc; -} - /************************************************************************** * * Interrupt and event queue testing @@ -699,8 +686,7 @@ int efx_selftest(struct efx_nic *efx, struct efx_self_tests *tests, { enum efx_loopback_mode loopback_mode = efx->loopback_mode; int phy_mode = efx->phy_mode; - enum reset_type reset_method = RESET_TYPE_INVISIBLE; - int rc_test = 0, rc_reset = 0, rc; + int rc_test = 0, rc_reset, rc; efx_selftest_async_cancel(efx); @@ -737,44 +723,26 @@ int efx_selftest(struct efx_nic *efx, struct efx_self_tests *tests, */ netif_device_detach(efx->net_dev); - mutex_lock(&efx->mac_lock); - if (efx->loopback_modes) { - /* We need the 312 clock from the PHY to test the XMAC - * registers, so move into XGMII loopback if available */ - if (efx->loopback_modes & (1 << LOOPBACK_XGMII)) - efx->loopback_mode = LOOPBACK_XGMII; - else - efx->loopback_mode = __ffs(efx->loopback_modes); - } - - __efx_reconfigure_port(efx); - mutex_unlock(&efx->mac_lock); - - /* free up all consumers of SRAM (including all the queues) */ - efx_reset_down(efx, reset_method); - - rc = efx_test_chip(efx, tests); - if (rc && !rc_test) - rc_test = rc; + if (efx->type->test_chip) { + rc_reset = efx->type->test_chip(efx, tests); + if (rc_reset) { + netif_err(efx, hw, efx->net_dev, + "Unable to recover from chip test\n"); + efx_schedule_reset(efx, RESET_TYPE_DISABLE); + return rc_reset; + } - /* reset the chip to recover from the register test */ - rc_reset = efx->type->reset(efx, reset_method); + if ((tests->registers < 0) && !rc_test) + rc_test = -EIO; + } /* Ensure that the phy is powered and out of loopback * for the bist and loopback tests */ + mutex_lock(&efx->mac_lock); efx->phy_mode &= ~PHY_MODE_LOW_POWER; efx->loopback_mode = LOOPBACK_NONE; - - rc = efx_reset_up(efx, reset_method, rc_reset == 0); - if (rc && !rc_reset) - rc_reset = rc; - - if (rc_reset) { - netif_err(efx, drv, efx->net_dev, - "Unable to recover from chip test\n"); - efx_schedule_reset(efx, RESET_TYPE_DISABLE); - return rc_reset; - } + __efx_reconfigure_port(efx); + mutex_unlock(&efx->mac_lock); rc = efx_test_phy(efx, tests, flags); if (rc && !rc_test) |