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authorJean Delvare <jdelvare@suse.de>2022-11-25 14:27:56 +0100
committerGreg Kroah-Hartman <gregkh@linuxfoundation.org>2023-01-19 14:59:55 +0100
commit98a59cd26e22e34ecae6af769cfc9f3b4ecd6c72 (patch)
treeadb62ae6be682bb3c7d18afc5fccb41473b1203b /drivers/tty/serial/Kconfig
parentf1c6c8b1b42dd72bd54adec003463650b84893d8 (diff)
serial: liteuart: drop obsolete dependency on COMPILE_TEST
Since commit 0166dc11be91 ("of: make CONFIG_OF user selectable"), it is possible to test-build any driver which depends on OF on any architecture by explicitly selecting OF. Therefore depending on COMPILE_TEST as an alternative is no longer needed. It is actually better to always build such drivers with OF enabled, so that the test builds are closer to how each driver will actually be built on its intended target. Building them without OF may not test much as the compiler will optimize out potentially large parts of the code. In the worst case, this could even pop false positive warnings. Dropping COMPILE_TEST here improves the quality of our testing and avoids wasting time on non-existent issues. Signed-off-by: Jean Delvare <jdelvare@suse.de> Cc: Karol Gugala <kgugala@antmicro.com> Cc: Mateusz Holenko <mholenko@antmicro.com> Cc: Gabriel Somlo <gsomlo@gmail.com> Cc: Joel Stanley <joel@jms.id.au> Cc: Greg Kroah-Hartman <gregkh@linuxfoundation.org> Acked-by: Gabriel Somlo <gsomlo@gmail.com> Link: https://lore.kernel.org/r/20221125142756.3e51a28d@endymion.delvare Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
Diffstat (limited to 'drivers/tty/serial/Kconfig')
-rw-r--r--drivers/tty/serial/Kconfig2
1 files changed, 1 insertions, 1 deletions
diff --git a/drivers/tty/serial/Kconfig b/drivers/tty/serial/Kconfig
index fc99bb09e045..eb236f7ca7f9 100644
--- a/drivers/tty/serial/Kconfig
+++ b/drivers/tty/serial/Kconfig
@@ -1507,7 +1507,7 @@ config SERIAL_MILBEAUT_USIO_CONSOLE
config SERIAL_LITEUART
tristate "LiteUART serial port support"
depends on HAS_IOMEM
- depends on OF || COMPILE_TEST
+ depends on OF
depends on LITEX || COMPILE_TEST
select SERIAL_CORE
help