diff options
Diffstat (limited to 'drivers/platform/x86/intel/ifs/ifs.h')
| -rw-r--r-- | drivers/platform/x86/intel/ifs/ifs.h | 97 |
1 files changed, 93 insertions, 4 deletions
diff --git a/drivers/platform/x86/intel/ifs/ifs.h b/drivers/platform/x86/intel/ifs/ifs.h index 56b9f3e3cf76..f369fb0d3d82 100644 --- a/drivers/platform/x86/intel/ifs/ifs.h +++ b/drivers/platform/x86/intel/ifs/ifs.h @@ -23,12 +23,14 @@ * IFS Image * --------- * - * Intel provides a firmware file containing the scan tests via - * github [#f1]_. Similar to microcode there is a separate file for each + * Intel provides firmware files containing the scan tests via the webpage [#f1]_. + * Look under "In-Field Scan Test Images Download" section towards the + * end of the page. Similar to microcode, there are separate files for each * family-model-stepping. IFS Images are not applicable for some test types. * Wherever applicable the sysfs directory would provide a "current_batch" file * (see below) for loading the image. * + * .. [#f1] https://intel.com/InFieldScan * * IFS Image Loading * ----------------- @@ -125,12 +127,38 @@ * 2) Hardware allows for some number of cores to be tested in parallel. * The driver does not make use of this, it only tests one core at a time. * - * .. [#f1] https://github.com/intel/TBD + * Structural Based Functional Test at Field (SBAF): + * ------------------------------------------------- + * + * SBAF is a new type of testing that provides comprehensive core test + * coverage complementing Scan at Field (SAF) testing. SBAF mimics the + * manufacturing screening environment and leverages the same test suite. + * It makes use of Design For Test (DFT) observation sites and features + * to maximize coverage in minimum time. + * + * Similar to the SAF test, SBAF isolates the core under test from the + * rest of the system during execution. Upon completion, the core + * seamlessly resets to its pre-test state and resumes normal operation. + * Any machine checks or hangs encountered during the test are confined to + * the isolated core, preventing disruption to the overall system. + * + * Like the SAF test, the SBAF test is also divided into multiple batches, + * and each batch test can take hundreds of milliseconds (100-200 ms) to + * complete. If such a lengthy interruption is undesirable, it is + * recommended to relocate the time-sensitive applications to other cores. */ #include <linux/device.h> #include <linux/miscdevice.h> #define MSR_ARRAY_BIST 0x00000105 + +#define MSR_COPY_SBAF_HASHES 0x000002b8 +#define MSR_SBAF_HASHES_STATUS 0x000002b9 +#define MSR_AUTHENTICATE_AND_COPY_SBAF_CHUNK 0x000002ba +#define MSR_SBAF_CHUNKS_AUTHENTICATION_STATUS 0x000002bb +#define MSR_ACTIVATE_SBAF 0x000002bc +#define MSR_SBAF_STATUS 0x000002bd + #define MSR_COPY_SCAN_HASHES 0x000002c2 #define MSR_SCAN_HASHES_STATUS 0x000002c3 #define MSR_AUTHENTICATE_AND_COPY_CHUNK 0x000002c4 @@ -140,6 +168,7 @@ #define MSR_ARRAY_TRIGGER 0x000002d6 #define MSR_ARRAY_STATUS 0x000002d7 #define MSR_SAF_CTRL 0x000004f0 +#define MSR_SBAF_CTRL 0x000004f8 #define SCAN_NOT_TESTED 0 #define SCAN_TEST_PASS 1 @@ -147,6 +176,7 @@ #define IFS_TYPE_SAF 0 #define IFS_TYPE_ARRAY_BIST 1 +#define IFS_TYPE_SBAF 2 #define ARRAY_GEN0 0 #define ARRAY_GEN1 1 @@ -196,7 +226,8 @@ union ifs_chunks_auth_status_gen2 { u16 valid_chunks; u16 total_chunks; u32 error_code :8; - u32 rsvd2 :24; + u32 rsvd2 :8; + u32 max_bundle :16; }; }; @@ -253,6 +284,34 @@ union ifs_array { }; }; +/* MSR_ACTIVATE_SBAF bit fields */ +union ifs_sbaf { + u64 data; + struct { + u32 bundle_idx :9; + u32 rsvd1 :5; + u32 pgm_idx :2; + u32 rsvd2 :16; + u32 delay :31; + u32 sigmce :1; + }; +}; + +/* MSR_SBAF_STATUS bit fields */ +union ifs_sbaf_status { + u64 data; + struct { + u32 bundle_idx :9; + u32 rsvd1 :5; + u32 pgm_idx :2; + u32 rsvd2 :16; + u32 error_code :8; + u32 rsvd3 :21; + u32 test_fail :1; + u32 sbaf_status :2; + }; +}; + /* * Driver populated error-codes * 0xFD: Test timed out before completing all the chunks. @@ -261,9 +320,28 @@ union ifs_array { #define IFS_SW_TIMEOUT 0xFD #define IFS_SW_PARTIAL_COMPLETION 0xFE +#define IFS_SUFFIX_SZ 5 + struct ifs_test_caps { int integrity_cap_bit; int test_num; + char image_suffix[IFS_SUFFIX_SZ]; +}; + +/** + * struct ifs_test_msrs - MSRs used in IFS tests + * @copy_hashes: Copy test hash data + * @copy_hashes_status: Status of copied test hash data + * @copy_chunks: Copy chunks of the test data + * @copy_chunks_status: Status of the copied test data chunks + * @test_ctrl: Control the test attributes + */ +struct ifs_test_msrs { + u32 copy_hashes; + u32 copy_hashes_status; + u32 copy_chunks; + u32 copy_chunks_status; + u32 test_ctrl; }; /** @@ -278,6 +356,7 @@ struct ifs_test_caps { * @generation: IFS test generation enumerated by hardware * @chunk_size: size of a test chunk * @array_gen: test generation of array test + * @max_bundle: maximum bundle index */ struct ifs_data { int loaded_version; @@ -290,6 +369,7 @@ struct ifs_data { u32 generation; u32 chunk_size; u32 array_gen; + u32 max_bundle; }; struct ifs_work { @@ -299,6 +379,7 @@ struct ifs_work { struct ifs_device { const struct ifs_test_caps *test_caps; + const struct ifs_test_msrs *test_msrs; struct ifs_data rw_data; struct miscdevice misc; }; @@ -319,6 +400,14 @@ static inline const struct ifs_test_caps *ifs_get_test_caps(struct device *dev) return d->test_caps; } +static inline const struct ifs_test_msrs *ifs_get_test_msrs(struct device *dev) +{ + struct miscdevice *m = dev_get_drvdata(dev); + struct ifs_device *d = container_of(m, struct ifs_device, misc); + + return d->test_msrs; +} + extern bool *ifs_pkg_auth; int ifs_load_firmware(struct device *dev); int do_core_test(int cpu, struct device *dev); |